Non-contact Resistivity Tester

Material:
Wafer  
solar cell

Application:
Resistance
Resistivity
Non-contact and non-destructive measurement
On-board Microprocessor for Accurate, Repeatable Measurements.
Teflon Wafer Stage for Easy, Non-abrasive Positioning
Integrated data aquisition and control electronics

Technique Specification

Wafer Size: 50mm-300mm.
Resistance Range :5-2000ohm / sq
Resistivity Range :0.1-50ohm.cm
Accuracy: 2%