Instrument >> Instrument for Wafer >> Wafer Defect observing instrument:HS-WDI
                

 

Application
Semiconductor wafer
Solar wafer
Solar Cell
Thin-film Cell




Can measure distance between any two points
Large advanced light and dark field objective, long working distance , high definition vision
Stable, high-quality optical system, better contrast image

 

 


Magnification: 50X-1000X
Digital camera: > 300 million pixel CCD
X, Y move range: 150mm × 180mm
Resolution:0.00042mm
Accuracy:±1μm
Magnification:100X(objective),10/15X(Eyepiece)

©2008-2050 HenergySolar. All rights reserved